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Welcome to HUIGUANG TECHNOLOGY (SUZHOU) CO.,LTD.!

HUIGUANG TECHNOLOGY (SUZHOU) CO.,LTD.
Add:No. 83 Weixin Road, Suzhou Industrial Park, Jiangsu Province, China
Pho:+86 18912792659
Tel:+86 0512-67625945
Fax:+86 0512-67629676

White Light Interferometer
Optical 3D Surface Profilometer
Optical 3D Surface Profilometer

Product model:
Createdate:2019-7-26 13:05:17
Hits:404 

White Light Interferometer-Optical 3D Surface Profilometer

Introduction TO Optical 3D Surface profilometer

Optical 3D Surface profilometer is an idealinstrument for sub-Nanometer measurement of various precision parts. Based onthe principle of white light interference technology, combined with precisionZ-direction scanning module and 3D modeling algorithm, it contactlessly scansthe surface of the object then establish a 3D image for the surface. A serialof 2D, 3D parameters  reflecting surfacequality of the object are obtained after XtremeVision software processes andanalyzes the 3D image.

Optical 3D Surface profilometer is a user-friendly precision opticalinstrument with powerful analysis functions for all kinds of surface form &roughness parameters. With unique light source it could measure variousprecision parts with both smooth and rough surface.

Technical specifications

Light source

Green LED

Video system

1024×1024(Optional 2048×2048)

Optical lens

10×、50× ,(Optional 2.5×,,20×,100×)

Optical zoom

1×(Optional 0.5×、0.75×)

Lens holder

3 holes-manual

XY Object table

Size

200×200mm

Moving range

100×100mm(Customization is supported)

Loading capacity

10kg

Control method

Motorized

Tilt

±4°Manual

Z Axis focusing

Moving range

100mm

Control method

Motorized

Scanning range of Z axis

2.2mm(bigger range is optional)

Resolution of Z axis

0.1nm

Max scanning speed

30μm/s

Stage measurement

Uncertainty

Repeatability

0.75%

0.1% 1σ

Remark: Performance parameters are testedby using a 4.7μm precision master stage gauge in lab according to ISO 4287 andISO 25178.

Zoom ratio of lens

2.5×

5×

10×

20×

50×

100×

Numerical hole diameter

0.075

0.13

0.3

0.4

0.55

0.7

Optical resolution @550nm(μm)

3.7

2.1

0.92

0.69

0.5

0.4

Depth of focus(μm)

48.6

16.2

3.04

1.71

0.9

0.56

Working distance(mm)

10.3

9.3

7.4

4.7

3.4

2.0

Field H×V

(mm)

Video system

1024×1024

0.5×

3.84×3.84

1.92×1.92

0.96×0.96

0.48×0.48

0.192×0.192

0.096×0.096

0.75×

2.56×2.56

1.28×1.28

0.64×0.64

0.32×0.32

0.128×0.128

0.064×0.064

1×

1.92×1.92

0.96×0.96

0.48×0.48

0.24×0.24

0.096×0.096

0.048×0.048

Video system

2048×2048

0.5×

8.96×8.96

4.48×4.48

2.24×2.24

1.12×1.12

0.448×0.448

0.224×0.224

0.75×

6.44×6.44

3.22×3.22

1.61×1.61

0.805×0.805

0.322×0.322

0.161×0.161

1×

4.48×4.48

2.24×2.24

1.12×1.12

0.56×0.56

0.224×0.224

0.112×0.112

Built-in ISO/ASME/EUR/GBT Standards of 2D, 3D parameters:

2D Parameters

Standard

Parameters

ISO 4287-1997


Principal section

Roughness

Waviness

Amplitude

Pp, Pv ,Pz, Pc, Pt,Pa,Pq,Psk,Pku

Rp, Rv ,Rz, Rc, Rt,Ra,Rq,Rsk,Rku

Wp, Wv ,Wz, Wc, Wt,Wa,Wq,Wsk,Wku

interval

PSm,Pdq

RSm,Rdq

WSm,Wdq

Substance

Pmr,Pdc

Rmr,Rdc,Rmr(Rz/4)

Wmr,Wdc,Wmr(Wz/4)

Peak

PPc

RPc

WPc

ISO 13565

ISO 13565-2

Rk,Rpk,Rvk,Mr1,Mr2,A1,A2,Rpk,Rvk

ISO 12085

Roughness graph

R,AR,R× ,Nr

Waviness graph

W,AW,W×,Wte

Other graph

Rke,Rpke,Rvke

AMSEB46.1

2D

Rt,Rp,Rv,Rz,Rpm,Rma×,Ra,Rq,Rsk,Rku,tp,Htp,Pc,Rda,Rdq,RSm,Wt

DIN EN ISO 4287-2010

Original profile

Pa,Pq,Pp,Pv,Pz,Pc,Pt,PSk,PKu,PSm,PPc,Pdq,Pdc,Pmr,

Roughness

Ra,Rq,Rp,Rv,Rz,Rc,Rt,RSk,RKu,RSm,RPc,Rdq,Rdc,Rmr,

Waviness

Wa,Wq,Wp,Wv,Wz,Wc,Wt,WSk,WKu,WSm,WPc,Wdq,Wdc,Wmr

JIS B0601-2013

Original profile

Pa,Pq,Pp,Pv,Pz,Pc,Pt,PSk,PKu,PSm,PPc,Pdq,Pdc,Pmr,

Roughness

Ra,Rq,Rp,Rv,Rz,Rc,Rt,RSk,RKu,RSm,Rdq,Rdc,Rmr

Waviness

Wa,Wq,Wp,Wv,Wz,Wc,Wt,WSk,WKu,WSm,WPc,Wdq,Wdc,Wmr

GBT 3505-2009

Original profile

Pa,Pq,Pp,Pv,Pz,Pc,Pt,PSk,PKu,PSm,PPc,Pdq,Pdc,Pmr,

Roughness

Ra,Rq,Rp,Rv,Rz,Rc,Rt,RSk,RKu,RSm,Rdq,Rdc,Rmr

Waviness

Wa,Wq,Wp,Wv,Wz,Wc,Wt,WSk,WKu,WSm,WPc,Wdq,Wdc,Wmr

3D Parameters

Standard

Parameters

ISO 25178

Height

Sq,Ssk,Sku,Sp,Sv,Sz,Sa

function

Smr,Smc,S×p

Space

Sal,Str,Std

Composite parameters

Sdq,Sdr

Volume

Vm,Vv,Vmp,Vmc,Vvc,Vvv

Form

Spd,Spc,S10z,S5p,S5v,Sda,Sha,Sdv,Shv

Functional

Sk,Spk,Svk,Smr1,Smr2,Spq,Svq,Smq

ISO 12781

Flatness

FLTt,FLTp,FLTv,FLTq

EUR 15178N

Amplitude

Sa,Sq,Sz,Ssk,Sku,Sp,Sv,St

Space

Str,Std,Sal

Composite parameters

Sdq,Sds,Ssc,Sdr,Sfd

Area, Volume

Smr,Sdc

Function

Sk,Spk,Svk,Sr1,Sr2,Spq,Svq,Smq

Functional

Sbi,Sci,Svi

EUR 16145 EN

Amplitude

Sa,Sq,Sy,Sz,Ssk,Sku

Mixed parameters

Ssc,Sdq,Sdr

Functional

Sbi,Sci,Svi,Sk,Spk,Svk

Space

Sds,Std,Stdi,Srw,Srwi

Hardness

Hs,Hvol,Hv,Hps,Hpvol,Hpv,Hap,Hbp

ASME B46.1

3D

St,Sp,Sv,Sq,Sa,Ssk,Sku,SWt

Applications

It is used for measurement and analysis ofsurface roughness and profile of precision components from industries ofsemi-conductor, 3C Electronics, ultraprecise machining, optical machining,micro-nano materials, micro-electro-mechanical system.

Measurement and analysis for variousproducts, components and materials`surface form and profile characteristics,such as flatness, roughness, waviness, appearance, surface defect,abrasion,corrosion, gap, hole, stage, curvature, deformation, etc.

3CElectronics_Sapphire crystal

3CElectronics _ Ink screen


Inaddition to the above applications, there are many applications for the Optical3D Surface Profilometer. Welcome to consult.

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